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Atomic Force Microscope Cantilever Array from China

Silicon nitride cantilever array for multi-mode AFM systems used in nanotechnology research. Repair components for 9810.00.60-admitted atomic force microscopes at university labs.

Duty Rate — China → United States

12.5%

Rate breakdown

9903.05.3112.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of China, as provided for in U.S. note 52 to this subchapter

Import Tips

Document spring constant and tip radius specifications; verify institutional research use; maintain 5-year non-commercial use records