KLA-Tencor Surfscan SP7 Unpatterned Wafer Scanner from Mexico
Surface scanning system for bare silicon wafer defectivity mapping using multi-angle darkfield optics and UV laser excitation. Detects haze, flatness deviations, and particles down to 20nm. Specifically for semiconductor wafer inspection under HTS 9031.41.00.
Duty Rate — Mexico → United States
0%
Rate breakdown
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• UV laser safety certification (IEC 60825) mandatory for customs clearance
• Specify wafer diameter range (200mm-450mm) in commercial invoice
• Avoid declaring as 'general surface scanner' to prevent misclassification