KLA-Tencor Surfscan SP7 Unpatterned Wafer Scanner from Japan
Surface scanning system for bare silicon wafer defectivity mapping using multi-angle darkfield optics and UV laser excitation. Detects haze, flatness deviations, and particles down to 20nm. Specifically for semiconductor wafer inspection under HTS 9031.41.00.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• UV laser safety certification (IEC 60825) mandatory for customs clearance
• Specify wafer diameter range (200mm-450mm) in commercial invoice
• Avoid declaring as 'general surface scanner' to prevent misclassification