BrightSpot Automation OWL Reticle Inspector from Japan
Programmable illumination reticle inspection system for photomask qualification using multiple wavelength sources and aerial image sensor technology. Used in semiconductor mask houses. HTS 9031.41.00 for reticle inspection.
Duty Rate — Japan → United States
0%
Rate breakdown
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Aerial image sensor technology specs distinguish classification
• Multiple wavelength source documentation required
• Mask house end-user statements prevent general optics classification