Multi-Wafer Cassette Optical Inspector from Canada
Non-contact optical system inspecting multiple semiconductor wafers in FOUP cassettes for particles and positioning without removal. Critical for fab logistics. Classified HTS 9031.41.0060 for other wafer inspection optics.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify FOUP compatibility (300mm wafers) and throughput specs
• Classify as inspection instrument, not storage/accessory equipment
• Include particle counting sensitivity documentation