Structured Light Wafer Scanner from China
Fringe projection structured light optical system for full-field 3D wafer shape measurement. Detects subtle global distortions affecting lithography overlay. HTS 9031.41.00.40 classification for specialized wafer inspection optics.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Fringe pattern resolution and projector wavelength specifications needed
• Distinguish from general 3D scanners via semiconductor flatness standards
• Software metrology algorithms may require separate IT classification