Cascade Microtech Wafer Prober Probes
High-precision tungsten carbide probes for semiconductor wafer testing equipment, making electrical connections to test points. Falls under HTS 8536.90.4000 as wafer probers for low-voltage circuit testing. Essential for IC manufacturing quality control.
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Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If complete wafer inspection systems
Full testing instruments fall under optical/measuring instruments.
If for welding/semiconductor manufacturing machines
Parts of semiconductor fab equipment in heading 8515.
If part of precision measuring probe sets
Measuring/testing instrument parts in Chapter 90.
Not sure which classification is right?
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Import Tips & Compliance
• Classify as individual probes, not complete prober systems (9030.90)
• Provide SEMI standards compliance certificates
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