Cascade Microtech Wafer Prober Probes

High-precision tungsten carbide probes for semiconductor wafer testing equipment, making electrical connections to test points. Falls under HTS 8536.90.4000 as wafer probers for low-voltage circuit testing. Essential for IC manufacturing quality control.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
🇨🇳ChinaFree+35.0%35%
🇲🇽MexicoFree+10.0%10%
🇨🇦CanadaFree+10.0%10%
🇩🇪GermanyFree+10.0%10%
🇯🇵JapanFree+10.0%10%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

9017.20.70.00Same rate: 35%

If complete wafer inspection systems

Full testing instruments fall under optical/measuring instruments.

8515.90.40.00Same rate: 35%

If for welding/semiconductor manufacturing machines

Parts of semiconductor fab equipment in heading 8515.

9031.90Lower: 10% vs 35%

If part of precision measuring probe sets

Measuring/testing instrument parts in Chapter 90.

Not sure which classification is right?

Our AI classifier can analyze your specific product and recommend the correct HTS code with confidence.

Import Tips & Compliance

Classify as individual probes, not complete prober systems (9030.90)

Provide SEMI standards compliance certificates