8536.90.40.00/Cascade Microtech Wafer Prober Probes/Japan

Cascade Microtech Wafer Prober Probes from Japan

High-precision tungsten carbide probes for semiconductor wafer testing equipment, making electrical connections to test points. Falls under HTS 8536.90.4000 as wafer probers for low-voltage circuit testing. Essential for IC manufacturing quality control.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter

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Import Tips

• Classify as individual probes, not complete prober systems (9030.90)

• Provide SEMI standards compliance certificates