8536.90.40.00/Cascade Microtech Wafer Prober Probes/Mexico

Cascade Microtech Wafer Prober Probes from Mexico

High-precision tungsten carbide probes for semiconductor wafer testing equipment, making electrical connections to test points. Falls under HTS 8536.90.4000 as wafer probers for low-voltage circuit testing. Essential for IC manufacturing quality control.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.05.5510%Except for products described in headings 9903.05.85–9903.05.92 and 9903.05.94, articles the product of Mexico, as provided for in U.S. note 52 to this subchapter

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Import Tips

• Classify as individual probes, not complete prober systems (9030.90)

• Provide SEMI standards compliance certificates