8536.90.40.00/Cascade Microtech Wafer Prober Probes/Mexico

Cascade Microtech Wafer Prober Probes from Mexico

High-precision tungsten carbide probes for semiconductor wafer testing equipment, making electrical connections to test points. Falls under HTS 8536.90.4000 as wafer probers for low-voltage circuit testing. Essential for IC manufacturing quality control.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter

Calculate with your customs value Verify classification with AI

Import Tips

• Classify as individual probes, not complete prober systems (9030.90)

• Provide SEMI standards compliance certificates