8461.90.30.80/CNC Slotter for Wafer Test Probes/Mexico

CNC Slotter for Wafer Test Probes from Mexico

Numerically controlled slotting machine that cuts precise grooves in probe cards and contacts for semiconductor wafer testing interfaces. Under 8461.90.30.80 as NC slotting for metal removal in semiconductor processing tooling. Ensures reliable electrical contact.

Duty Rate — Mexico → United States

14.4%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
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Import Tips

• Include probe pitch accuracy data; distinguish from Chapter 90 testers; EAR registration for test tech

CNC Slotter for Wafer Test Probes from Mexico — Import Duty Rate | HTS 8461.90.30.80