</>Build with Tariff Intelligence|Programmatic access to tariff calculations and HS code classification.Explore Developer Resources →
8461.90.30.80/CNC Slotter for Wafer Test Probes/Japan

CNC Slotter for Wafer Test Probes from Japan

Numerically controlled slotting machine that cuts precise grooves in probe cards and contacts for semiconductor wafer testing interfaces. Under 8461.90.30.80 as NC slotting for metal removal in semiconductor processing tooling. Ensures reliable electrical contact.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Calculate with your customs valueVerify classification with AI

Import Tips

• Include probe pitch accuracy data; distinguish from Chapter 90 testers; EAR registration for test tech