Other
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. > Other optical instruments and appliances: > Other > Other > Other
Duty Rate (from China)
Products classified under Tariff item 9031.49.90.00
Autocollimator Optical Alignment System
The Autocollimator Optical Alignment System is a precision instrument measuring small angular deviations for machine tool alignment and optical testing. It is an electronic autocollimator used in metrology laboratories, fitting under tariff item 9031.49.90 as an 'Other' optical measuring instrument.
9031.49.90Chromatic Confocal Sensor
The Chromatic Confocal Sensor is a non-contact optical sensor using chromatic aberration for high-speed surface profiling and thickness measurement. It is an advanced optical measuring technology under tariff item 9031.49.90 for inline production monitoring.
9031.49.90Confocal Laser Scanning Gauge
The Confocal Laser Scanning Gauge is a point sensor using confocal laser scanning for precise distance and thickness measurement in production lines. It is an industrial optical measuring instrument under tariff item 9031.49.90 for automated quality control.
9031.49.90Conoscopic Holography Sensor
The Conoscopic Holography Sensor is a compact optical sensor using conoscopic holography for 3D surface profiling and vibration analysis. It is an advanced optical measuring instrument under tariff item 9031.49.90 for R&D and production metrology applications.
9031.49.90Digital Holographic Microscope
The Digital Holographic Microscope combines digital holography with microscopy for 3D quantitative imaging and surface metrology. It falls under tariff item 9031.49.90 when the measurement function predominates over microscopic observation.
9031.49.90DUV Mask Metrology Station
A deep ultraviolet metrology station used to measure chrome patterns, quartz thickness, and defectivity on DUV photomasks in semiconductor fabs. It is automated for high-volume inspection and relies on optical measurement techniques. This places it under tariff item 9031.49.90 as an other optical measuring or checking instrument.
9031.49.90EUV Mask Inspector
A specialized inspector for extreme ultraviolet (EUV) lithography masks, detecting phase defects and absorber irregularities critical for advanced semiconductor nodes. It uses actinic wavelength imaging to perform optical inspection. This qualifies as an other optical measuring or checking instrument under tariff item 9031.49.90.
9031.49.90Fringe Projection Profilometer
The Fringe Projection Profilometer is a high-speed optical profilometer using phase-shifted fringe patterns for dynamic surface measurement. It is a precision optical instrument under tariff item 9031.49.90 for automotive and aerospace quality assurance.
9031.49.90InspecVision Planar 200 Profile Projector
The InspecVision Planar 200 is a profile projector that combines traditional optical projection with sub-pixel camera technology for precise 2D measurements of parts up to 200mm. It falls under tariff item 9031.49.90 as an 'Other' optical instrument for measuring or checking, not specified elsewhere in Chapter 90.
9031.49.90Laser Particle Surface Profiler
A laser scanning profiler that measures topography and particulate distribution on semiconductor device surfaces post-processing. It generates 3D contamination maps for yield analysis using optical scanning. This is an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90Laser Surface Profilometer
The Laser Surface Profilometer is a precision instrument using laser interferometry to measure surface roughness and topography on manufactured parts. It is classified under tariff item 9031.49.90 as an 'Other' optical measuring instrument for quality control in precision engineering.
9031.49.90Machine Vision Gauging System
The Machine Vision Gauging System is an industrial camera-based system with telecentric lenses for automated dimensional inspection and defect detection. It falls under tariff item 9031.49.90 as an optical measuring machine for high-volume manufacturing quality control.
9031.49.90Mitutoyo PH-350 Profile Projector
The Mitutoyo PH-350 is a high-precision optical profile projector used for measuring contours and dimensions of small parts in manufacturing quality control. It projects magnified images onto a screen for comparison, fitting under tariff item 9031.49.90 as an 'Other' optical measuring instrument.
9031.49.90Moiré Fringe Pattern Analyzer
The Moiré Fringe Pattern Analyzer is an optical instrument analyzing moiré interference patterns for strain measurement and surface profiling. It is a specialized optical measuring system classified under tariff item 9031.49.90 for materials testing applications.
9031.49.90Nanoparticle Deposition Monitor
A monitor that detects nanoparticle deposition and surface contamination on semiconductor wafers using condensation particle counting technology. It is critical for advanced node yield control and operates as an optical detection system. This falls under tariff item 9031.49.90 as an other optical measuring instrument.
9031.49.90Nikon V-16B Profile Projector
The Nikon V-16B is a vertical benchtop profile projector offering 10x-100x magnification for small parts inspection in electronics and aerospace. Its optical system projects clear profiles for template comparison, classifying it under tariff item 9031.49.90 as an 'Other' optical measuring instrument.
9031.49.90Optical CMM Coordinate Measuring Machine
The Optical CMM Coordinate Measuring Machine is a non-contact coordinate measuring machine using optical sensors and cameras for 3D dimensional inspection of complex geometries. It falls under tariff item 9031.49.90 as an 'Other' optical measuring instrument for industrial metrology, despite its name, because it is not a traditional coordinate measuring machine.
9031.49.90Optical Flatness Tester
An interferometric instrument measuring surface flatness of precision optical components and gauge blocks. It is a precision optical measuring instrument used in gauge and optical manufacturing. This falls under tariff item 9031.49.90 as an other optical measuring instrument.
9031.49.90Phase Measuring Interferometer
An advanced optical instrument for phase map measurement of optical surfaces and wavefront analysis. It is high-precision metrology equipment used in optics manufacturing quality control. This is classified under tariff item 9031.49.90 as an other optical measuring instrument.
9031.49.90Photomask Pattern Analyzer
An automated analyzer that measures critical dimensions and overlay accuracy on photomasks for semiconductor production. It uses interferometry to verify pattern fidelity against design data, making it an optical measuring instrument. This is classified under tariff item 9031.49.90.
9031.49.90Ram Optical VM-1540 Profile Projector
The Ram Optical VM-1540 video contour projector merges traditional profile projection with video edge detection for versatile quality assurance. Its optical projection system qualifies it under tariff item 9031.49.90 as an 'Other' optical measuring instrument.
9031.49.90Reticle Qualification Tool
A tool for comprehensive qualification testing of binary and phase-shift masks, including blank inspection and pattern verification for semiconductor production. It integrates multiple optical modules for measurement. This qualifies as an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90Reticles Defect Scanner
A high-precision scanner for inspecting reticle defects in extreme ultraviolet (EUV) lithography masks used in advanced semiconductor nodes. It utilizes UV light and AI algorithms for sub-10nm defect detection. This is an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90Semiconductor Mask Inspection System
An optical inspection system designed specifically for detecting defects in photomasks and reticles used in semiconductor photolithography processes. It employs high-resolution imaging and automated analysis to ensure mask quality. This falls under tariff item 9031.49.90 as an other optical measuring instrument.
9031.49.90Semiconductor Wafer Cleanliness Tester
An optical tester for non-destructive measurement of surface particulate and organic contamination on bare silicon wafers. It employs dark-field microscopy for real-time cleanroom monitoring. This is an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90Starrett HB400 Profile Projector
The Starrett HB400 horizontal beam profile projector features a 16-inch screen for detailed inspection of complex profiles in precision engineering. Designed for dimensional measurement and geometric tolerances, it falls under tariff item 9031.49.90 as an 'Other' optical measuring instrument.
9031.49.90Structured Light 3D Scanner
An optical 3D scanner projecting structured light patterns for high-resolution surface digitization and reverse engineering. It is used for industrial optical measuring and profiling applications. This qualifies as an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90Telecentric Optical Comparator
A profile projector alternative using telecentric optics for distortion-free 2D measurement of small precision parts. It is classified as an other optical measuring instrument replacing traditional optical comparators. This falls under tariff item 9031.49.90.
9031.49.90Wafer Surface Particle Counter
A laser-based airborne and surface particle measurement tool for quantifying particulate contamination on semiconductor wafers during fabrication. It scans surfaces to detect particles as small as 10nm, ensuring cleanliness. This qualifies as an other optical measuring instrument under tariff item 9031.49.90.
9031.49.90White Light Interferometer
An optical instrument measuring surface form and finish using white light interferometry for sub-micron precision. It is used in semiconductor and optics manufacturing. This is an other optical measuring instrument under tariff item 9031.49.90.