Atomic Force Microscope Probe Tips
Silicon cantilever probe tips with nanoscale sharp points used to scan surfaces in atomic force microscopes (AFMs). These are consumable accessories essential for AFM operation, falling under parts and accessories for non-optical microscopes.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If probe tips are included with a new AFM purchase
Accessories presented with the complete microscope are classified with the main instrument.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify probe tips as accessories for AFMs and keep packaging intact to show they are not standalone instruments
• Provide the AFM model they are compatible with to expedite CBSA review
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