Parts and accessories
Microscopes other than optical microscopes; diffraction apparatus. > Parts and accessories > Parts and accessories
Duty Rate (from China)
Products classified under Tariff item 9012.90.00.00
AFM Vibration Isolation Platform Mounts
Vibration isolation platform mounts specifically designed for atomic force microscopes (AFMs), a type of non-optical microscope. These mounts damp external vibrations to ensure nanometer-scale measurement accuracy, making them dedicated parts or accessories for AFM systems.
9012.90.00Atomic Force Microscope Probe Tips
Silicon cantilever probe tips with nanoscale sharp points used to scan surfaces in atomic force microscopes (AFMs). These are consumable accessories essential for AFM operation, falling under parts and accessories for non-optical microscopes.
9012.90.00Diffraction Apparatus Calibration Grids
Precision gold calibration grids used to align and calibrate electron diffraction apparatus, which falls under diffraction apparatus in heading 9012. These grids are essential accessories for ensuring accurate lattice measurements in diffraction analysis.
9012.90.00Diffraction Powder Sample Spinner
Motorized spinner stage for rotating powder samples uniformly in electron diffraction apparatus. This accessory reduces preferred orientation artifacts, making it a dedicated part for diffraction equipment under heading 9012.
9012.90.00Electron Microscope Control Software Dongle
Hardware security dongle with embedded firmware used to license and interface electron microscope control software. As a dedicated accessory for non-optical microscopes, it enables authorized operation and is classified under parts and accessories.
9012.90.00Electron Microscope Cryo-Holder
Liquid nitrogen-cooled specimen holder for cryogenic electron microscopy in transmission electron microscopes (TEMs). This accessory enables imaging of frozen biological samples and is dedicated to non-optical microscopes.
9012.90.00Electron Microscope Objective Lens
Precision electromagnetic lens assembly designed for scanning electron microscopes (SEMs) to focus the electron beam. This is a dedicated part for non-optical microscopes, essential for imaging performance.
9012.90.00Microscope Diffraction Pattern Camera
Digital imaging camera optimized for capturing electron diffraction patterns from non-optical microscopes like TEMs. This accessory is essential for recording diffraction data and falls under parts for diffraction apparatus.
9012.90.00Microscope Stage Joystick Controller
Handheld joystick controller for precise manual control of electron microscope sample stages. This accessory is designed specifically for non-optical microscopes, improving operator control during imaging.
9012.90.00Scanning Electron Microscope Sample Stage
Motorized XY stage for holding and positioning specimens under a scanning electron microscope. This is a principal accessory for SEMs, enabling automated sample movement and precise imaging.
9012.90.00SEM Ionizer Accessory
Electron flood gun ionizer for neutralizing surface charge on non-conductive SEM samples. This dedicated accessory improves imaging of plastics and biological specimens in non-optical microscopes.
9012.90.00SEM Secondary Electron Detector
Scintillator-based detector for capturing secondary electrons in scanning electron microscopes. This essential part converts electrons to photons for PMT readout, enabling surface topography imaging.
9012.90.00SEM Vacuum Pump Adapter Kit
Custom adapter flanges and seals connecting turbo pumps to scanning electron microscope chambers. These parts are designed specifically for SEMs to maintain ultra-high vacuum for clear imaging.
9012.90.00TEM Aperture Strip
Carousel strip holding interchangeable objective and condenser apertures for transmission electron microscopes. This precision-machined platinum part optimizes beam alignment and resolution in non-optical microscopes.
9012.90.00Transmission Electron Microscope Specimen Holder
Specialized grid holder for thin-section samples in transmission electron microscopes (TEMs), designed for high-vacuum and tilt functionality. This accessory is dedicated to non-optical microscopes for structural analysis.