Atomic Force Microscope Probe Tips from United States
Silicon cantilever probe tips with nanoscale sharp points used to scan surfaces in atomic force microscopes (AFMs). These are consumable accessories essential for AFM operation, falling under parts and accessories for non-optical microscopes.
Duty Rate — United States → Canada
0%
Import Tips
• Classify probe tips as accessories for AFMs and keep packaging intact to show they are not standalone instruments
• Provide the AFM model they are compatible with to expedite CBSA review