Thermo Fisher Helios 5 DualBeam FIB-SEM from Japan
Thermo Fisher's Helios 5 combines focused ion beam milling with electron beam imaging, featuring semiconductor lift-out grids and wafer handling for sample preparation. Classified HTS 9031.80.40.00 due to integrated transport for cross-section analysis of semiconductor devices. Essential for failure analysis and process development.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify gallium ion source safety data sheets and vacuum pumping system details
• Confirm SEMI S2/S8 safety compliance certifications
• Pitfall: improper declaration of ion beam components can trigger hazardous material scrutiny