Thermo Fisher Helios 5 DualBeam FIB-SEM from China
Thermo Fisher's Helios 5 combines focused ion beam milling with electron beam imaging, featuring semiconductor lift-out grids and wafer handling for sample preparation. Classified HTS 9031.80.40.00 due to integrated transport for cross-section analysis of semiconductor devices. Essential for failure analysis and process development.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Specify gallium ion source safety data sheets and vacuum pumping system details
• Confirm SEMI S2/S8 safety compliance certifications
• Pitfall: improper declaration of ion beam components can trigger hazardous material scrutiny