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9031.80.40.00/Thermo Fisher Helios 5 DualBeam FIB-SEM/Canada

Thermo Fisher Helios 5 DualBeam FIB-SEM from Canada

Thermo Fisher's Helios 5 combines focused ion beam milling with electron beam imaging, featuring semiconductor lift-out grids and wafer handling for sample preparation. Classified HTS 9031.80.40.00 due to integrated transport for cross-section analysis of semiconductor devices. Essential for failure analysis and process development.

Duty Rate — Canada → United States

0%

Rate breakdown

9903.05.860%Universal product exemption (U.S. note 52(b))
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Import Tips

• Specify gallium ion source safety data sheets and vacuum pumping system details

• Confirm SEMI S2/S8 safety compliance certifications

• Pitfall: improper declaration of ion beam components can trigger hazardous material scrutiny

Thermo Fisher Helios 5 DualBeam FIB-SEM from Canada — Import Duty Rate | HTS 9031.80.40.00