Wafer Surface Particle Counter from Mexico
A laser-based airborne and surface particle measurement tool for quantifying particulate contamination on semiconductor wafers during fabrication. It scans surfaces to detect particles as small as 10nm, ensuring cleanliness standards. Falls under HTS 9031.49.70.00 for its role in measuring surface particulate contamination on semiconductor devices.
Duty Rate — Mexico → United States
0%
Rate breakdown
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Provide calibration certificates traceable to NIST standards, as particle sizing accuracy is critical for customs valuation
• Declare cleanroom compatibility class (e.g
• ISO 3) and obtain pre-shipment inspection reports to prevent delays
• Avoid common pitfalls by separating particle counters from general air quality monitors in documentation