Wafer Surface Particle Counter from China
A laser-based airborne and surface particle measurement tool for quantifying particulate contamination on semiconductor wafers during fabrication. It scans surfaces to detect particles as small as 10nm, ensuring cleanliness standards. Falls under HTS 9031.49.70.00 for its role in measuring surface particulate contamination on semiconductor devices.
Duty Rate — China → United States
35%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
Import Tips
• Provide calibration certificates traceable to NIST standards, as particle sizing accuracy is critical for customs valuation
• Declare cleanroom compatibility class (e.g
• ISO 3) and obtain pre-shipment inspection reports to prevent delays
• Avoid common pitfalls by separating particle counters from general air quality monitors in documentation