Semiconductor Wafer Cleanliness Tester from Japan
Optical tester for non-destructive measurement of surface particulate and organic contamination on bare silicon wafers. Employs dark-field microscopy for real-time cleanroom monitoring. Qualifies under HTS 9031.49.70.00 for measuring surface particulate contamination on semiconductor devices.
Duty Rate — Japan → United States
0%
Rate breakdown
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Document particle size detection range (e.g
• 20nm-10μm) and throughput specs for customs review
• Obtain FDA equivalence if dual-use in pharmaceutical cleanrooms, though primarily semiconductor
• Bundle with stage adapters only if specified for wafer sizes; otherwise classify separately