Reticle Qualification Tool from Japan
Tool for comprehensive qualification testing of binary and phase-shift masks, including blank inspection and pattern verification for semiconductor production. Integrates multiple optical modules. HTS 9031.49.70.00 covers mask inspection systems.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Break down modular components for potential duty optimization if imported separately
• Provide mask size compatibility (e.g
• 6-inch quartz) and pellicle handling specs
• Ensure software is licensed for semiconductor use only