Onto Innovation Firefly NDT Wafer Defect Review System from Japan
High-throughput noise defect termination system for patterned wafer review using broadband plasma illumination and programmable apertures. Automates defect classification for semiconductor process control. Classified under HTS 9031.41.00.
Duty Rate — Japan → United States
0%
Rate breakdown
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Plasma light source safety data sheets required for import
• Defect classification algorithm export compliance documentation
• Specify fab integration interfaces (SEC/GEM) in declarations