KLA-Tencor 8950E Patterned Wafer Inspector from Mexico
High-volume production patterned wafer inspection system with simultaneous frontside/backside inspection capability using programmable illumination. Detects defects down to 40nm. Standard HTS 9031.41.00 classification.
Duty Rate — Mexico → United States
0%
Rate breakdown
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Dual-sided inspection methodology documentation essential
• Programmable DUV/visible light source specs required
• 300mm wafer handling certification verifies semiconductor use