KLA-Tencor 8950E Patterned Wafer Inspector from China
High-volume production patterned wafer inspection system with simultaneous frontside/backside inspection capability using programmable illumination. Detects defects down to 40nm. Standard HTS 9031.41.00 classification.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Dual-sided inspection methodology documentation essential
• Programmable DUV/visible light source specs required
• 300mm wafer handling certification verifies semiconductor use