UV Fluorescence Wafer Inspector from China
Specialized UV optical system detecting organic contaminants and subsurface defects on semiconductor wafers via fluorescence imaging. Essential for post-CMP process monitoring. HTS 9031.41.0060 for other optical wafer inspection appliances.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Document UV wavelength specs (e.g
• 365nm) confirming semiconductor material compatibility
• Separate software licenses if applicable, as they may classify differently under 8523
• Verify not classified as laboratory microscope per Chapter 90 exclusions