9031.41.00.60/Advanced Packaging Wafer Inspector/Mexico

Advanced Packaging Wafer Inspector from Mexico

Optical inspection system for fan-out wafer-level packaging (FOWLP) semiconductor wafers, checking redistribution layers and underfill voids. Essential for heterogeneous integration. HTS 9031.41.0060 for other wafer optical inspection.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
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Import Tips

• Specify packaging structure compatibility (RDL, microbumps)

• Distinguish from standard logic/memory wafer inspection

• Include 2.5D/3D packaging metrology capabilities

Advanced Packaging Wafer Inspector from Mexico — Import Duty Rate | HTS 9031.41.00.60