Advanced Packaging Wafer Inspector from China

Optical inspection system for fan-out wafer-level packaging (FOWLP) semiconductor wafers, checking redistribution layers and underfill voids. Essential for heterogeneous integration. HTS 9031.41.0060 for other wafer optical inspection.

Duty Rate — China → United States

35%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

Import Tips

Specify packaging structure compatibility (RDL, microbumps)

Distinguish from standard logic/memory wafer inspection

Include 2.5D/3D packaging metrology capabilities