Wafer Flatness Profiler from Germany
Non-contact optical profiler using white light interferometry to measure wafer thickness variation and surface flatness. Essential for ensuring silicon wafer planarity before lithographic processing. Specifically classified in HTS 9031.41.00.40 for semiconductor wafer optical inspection.
Duty Rate — Germany → United States
0%
Rate breakdown
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Include interferometer wavelength specifications and resolution data in commercial invoice
• Classify vibration isolation tables separately if imported as components