Oblique Illumination Wafer Inspector from China
Specialized optical system using oblique angle illumination to enhance topographic defect visibility on patterned semiconductor wafers. Ideal for detecting shallow pits and mounds. Classified HTS 9031.41.00.40 for wafer optical inspection optimization.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Illumination angle and polarization specifications required for optical review
• Patterned wafer compatibility distinguishes from blank wafer inspectors
• Software algorithms treating as machine vision may risk 8479 classification