Laser Doppler Wafer Vibrometer from Germany
Non-contact laser Doppler vibrometry system measuring wafer vibration modes and chucking stability during processing. Critical for overlay improvement. Borderline HTS 9031.41.00.40 for wafer optical inspection applications.
Duty Rate — Germany → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Frequency response range (DC-20MHz) and velocity sensitivity specs required
• Prove wafer chucking application vs general vibrometry
• Risk reclassification as acoustic measurement under 9031.80