Darkfield Wafer Inspection Microscope from Japan
High NA darkfield optical microscope optimized for detecting sub-micron particles on polished semiconductor wafers. Features automated stage and pattern recognition software. HTS 9031.41.00.40 designation for wafer-specific optical inspection systems.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Magnification and numerical aperture specs required for optical instrument verification
• Distinguish from laboratory microscopes via semiconductor-specific software licensing