Darkfield Wafer Inspection Microscope from China
High NA darkfield optical microscope optimized for detecting sub-micron particles on polished semiconductor wafers. Features automated stage and pattern recognition software. HTS 9031.41.00.40 designation for wafer-specific optical inspection systems.
Duty Rate — China → United States
35%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
Import Tips
• Magnification and numerical aperture specs required for optical instrument verification
• Distinguish from laboratory microscopes via semiconductor-specific software licensing