Automated Wafer Particle Counter from China
Dark-field optical microscope system automatically counting and sizing contamination particles on unpatterned semiconductor wafers. Critical for yield optimization in wafer fabrication cleanrooms. HTS 9031.41.00.40 covers this specialized optical wafer inspection equipment.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Cleanroom packaging required; include material safety data sheets for optical fluids and laser safety
• Demonstrate wafer-specific design via technical drawings to distinguish from general microscopes
• Avoid delays by pre-submitting semiconductor end-user declarations to CBP