CyberOptics SQ3000 Reticle Dimension Metrology Tool from China
Advanced 3D dimension metrology system using structured light for measuring photomask critical dimensions, sidewall angles, and overlay targets. Supports 5nm node requirements for mask qualification. Classified HTS 9031.41.0020 for reticle inspection in semiconductor manufacturing.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Include calibration artifacts traceable to international metrology standards
• Document 24/7 uptime specifications typical for fab tools
• Avoid mechanical gauge classification by emphasizing non-contact optical method