Camtek EagleR 3D Reticle Metrology System from Canada
3D optical metrology tool for measuring reticle surface topography, overlay marks, and critical dimensions on photomasks. Combines white light interferometry with pattern recognition for sub-1nm precision. HTS 9031.41.0020 due to specialized semiconductor reticle inspection function.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Provide metrology uncertainty specifications (typically <1nm) to support classification
• Include software validation certificates for pattern recognition algorithms
• Separate optical head imports from base units if lower duty rates apply to components