Bruker ContourGT Reticle Surface Profiler from China
White light interferometric surface profiler optimized for measuring photomask blank surface roughness and topography critical for defect printability analysis. Sub-angstrom resolution meets semiconductor reticle specifications. Falls under HTS 9031.41.0020 for photomask inspection instrumentation.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Include SEMI-standard compliance certificates (SEMI MF series for surface measurement)
• Specify vacuum chuck specifications for reticle fixturing
• Separate software licenses if imported separately to manage valuation