9030.82.00.00/Wafer Particle Counter Scanner/China

Wafer Particle Counter Scanner from China

Laser scattering system that scans wafers to count and size contamination particles that could cause IC defects. Meets strict cleanroom standards for semiconductor production. Under HTS 9030.82.00.00 for semiconductor wafer checking instruments.

Duty Rate — China → United States

35%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter

9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

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Import Tips

• Specify particle size detection range (down to 0.01μm) to confirm semiconductor cleanroom application

• Include cleanroom classification (ISO 3/4) in technical documentation

• Ensure laser safety classification documentation for customs clearance