Semiconductor Wafer Resistivity Mapping System from China
Four-point probe system mapping resistivity variation across silicon wafers to monitor doping uniformity in IC fabrication. Generates 2D/3D resistivity maps. Under HTS 9030.82.00.00 for semiconductor wafer checking.
Duty Rate — China → United States
25%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Specify probe spacing and current injection specs for semiconductor resistivity measurement
• Include doping concentration range documentation for classification
• Avoid general material testing classification by emphasizing wafer mapping function