LED Wafer Testing Microprobe Station from Japan
Microprobe station electrically characterizing LED chips and microLED arrays on wafer before singulation. Tests luminous efficacy, forward voltage, etc. HTS 9030.82.00.00 for semiconductor device checking including optoelectronic ICs.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify optoelectronic parameter test capabilities (I-V, L-I curves)
• Include probe pitch resolution for dense LED array testing
• Document thermal chuck specifications for accurate junction temperature testing