9030.82.00.00/LED Wafer Testing Microprobe Station/China

LED Wafer Testing Microprobe Station from China

Microprobe station electrically characterizing LED chips and microLED arrays on wafer before singulation. Tests luminous efficacy, forward voltage, etc. HTS 9030.82.00.00 for semiconductor device checking including optoelectronic ICs.

Duty Rate — China → United States

25%

Rate breakdown

9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter

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Import Tips

• Specify optoelectronic parameter test capabilities (I-V, L-I curves)

• Include probe pitch resolution for dense LED array testing

• Document thermal chuck specifications for accurate junction temperature testing