IC Parametric Electrical Analyzer from Canada
Precision instrument testing electrical parameters of individual transistors and ICs on wafer for process control monitoring. Measures leakage current, threshold voltage, etc. Classified under HTS 9030.82.00.00 for semiconductor device checking.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify parameter measurement capabilities (IV, CV curves) to distinguish from general multimeters
• Include semiconductor fab voltage range specifications in documentation
• Provide test structure compatibility info to avoid general electrical meter classification