Compound Semiconductor Wafer Analyzer from Japan
Multi-technique analyzer for GaAs, GaN, SiC wafers measuring sheet resistance, carrier mobility, and Hall effect for RF and power electronics. Essential for compound semiconductor IC production. HTS 9030.82.00.00 classification.
Duty Rate — Japan → United States
0%
Rate breakdown
9903.05.860%Universal product exemption (U.S. note 52(b))
Import Tips
• Specify substrate compatibility (GaN, SiC, GaAs) and measurement techniques
• Include magnetic field strength specs for Hall measurement
• Document exclusion of silicon-only wafer testing applications