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Compound Semiconductor Wafer Analyzer from China

Multi-technique analyzer for GaAs, GaN, SiC wafers measuring sheet resistance, carrier mobility, and Hall effect for RF and power electronics. Essential for compound semiconductor IC production. HTS 9030.82.00.00 classification.

Duty Rate — China → United States

25%

Rate breakdown

9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.860%Universal product exemption (U.S. note 52(b))

Import Tips

Specify substrate compatibility (GaN, SiC, GaAs) and measurement techniques

Include magnetic field strength specs for Hall measurement

Document exclusion of silicon-only wafer testing applications