Compound Semiconductor Wafer Analyzer from Canada
Multi-technique analyzer for GaAs, GaN, SiC wafers measuring sheet resistance, carrier mobility, and Hall effect for RF and power electronics. Essential for compound semiconductor IC production. HTS 9030.82.00.00 classification.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify substrate compatibility (GaN, SiC, GaAs) and measurement techniques
• Include magnetic field strength specs for Hall measurement
• Document exclusion of silicon-only wafer testing applications