X-Ray Diffraction Apparatus from Japan
X-ray diffraction apparatus directs X-rays at crystalline samples to analyze atomic and molecular structure through diffraction patterns. It qualifies for HTS 9012.10.00.00 as diffraction apparatus, distinct from optical microscopes. Widely used in materials science for phase identification and crystallography.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Include radiation safety certifications (e.g
• FDA performance standards) and shielding specifications
• Document wavelength range (Cu Kα typical) and goniometer details for accurate HTS verification
• Avoid misclassification by separating software licenses; bundled systems risk higher duties