Transmission Electron Microscope (TEM) from Japan
Transmission electron microscopes (TEM) transmit a beam of electrons through an ultra-thin specimen to form images at atomic resolution. Classified under HTS 9012.10.00.00 as a non-optical microscope using electron transmission for imaging. Ideal for studying internal structures in nanotechnology and life sciences.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Provide vacuum system specifications and radiation safety certifications due to high-voltage electron sources
• Declare sample stage dimensions and magnification range accurately for proper tariff verification