Scanning Tunneling Microscope (STM) from Japan
Scanning tunneling microscopes (STM) measure quantum tunneling currents between a sharp probe and sample surface for atomic-scale imaging. Falls under HTS 9012.10.00.00 as a non-optical microscope using electron tunneling. Essential for surface science and nanotechnology research.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Specify vibration isolation requirements and piezo scanner specifications in import docs
• Include cryogenic capability details if ultra-high vacuum (UHV) model