Scanning Electron Microscope (SEM) from Canada
A scanning electron microscope (SEM) uses a focused beam of electrons to produce high-resolution images of a sample's surface topography and composition. It falls under HTS 9012.10.00.00 as it is a microscope other than an optical microscope, relying on electron microscopy rather than light optics. Commonly used in materials science and biology for detailed surface analysis.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Verify CE marking or equivalent for electron beam safety and obtain FCC certification if equipped with digital imaging components
• Include detailed technical specifications and end-user certificates to confirm laboratory/research use and avoid dual-use export controls