9012.10.00.00/Helium Ion Microscope/Japan

Helium Ion Microscope from Japan

Helium ion microscopes use He+ ions for sub-nanometer surface imaging with minimal sample damage. HTS 9012.10.00.00 as charged particle non-optical microscope. Superior for insulators and beam-sensitive materials.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%

Calculate with your customs value Verify classification with AI

Import Tips

• Include ion source gas handling system details

• Certify for noble gas containment